Abdelkhalak El Hami et Philippe Pougnet
Elsevier, Chapter 2, 2015, 978-1-78548-013-3 – insu-01155342

Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices
Dahoo P.-R., Khettab M., Linares J., Pougnet P.