Reliability of Multiphysical Systems Set – Volume 2

Pierre Richard Dahoo, University of Versailles Saint-Quentin, Philippe Pougnet, Vedecom Institute, Versailles, Abdelkhalak El Hami, Institut National des Sciences Appliquées (INSA-Rouen), France
ISTE Editions,  John Wiley 2016

Nanometer-scale Defect Detection Using Polarized Light.

Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El-Hami.
ISTE Editions, John Wiley. August 2016,  316 pp.

Défauts à l’échelle nanométrique en lumière polarisée.

Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
ISTE Editions, 2, 290 p., 2016,Collection: Génie mécanique et mécanique des solides,Série: Fiabilité des systèmes multiphysiques, 978-1-78405-165-5. <http://iste-editions.fr>.

Vector potential quantization and the photon wave-particle representation

Journal of Physics: Conference Series 738 (2016) 012099
C Meis1* and P R Dahoo2
1 CEA Saclay. National Institute for Nuclear Science and Technology,Université Paris Saclay – 91191 Gif-sur-Yvette, France.
2 LATMOS /IPSL, UVSQ Université Paris-Saclay, UPMC Univ. Paris 06, CNRS,F-78280, Guyancourt, France.

Monte Carlo Method Applied to the ABV Model of an Interconnect Alloy

Journal of Physics: Conference Series 738 (2016) 012073
P R Dahoo1,2*, J Linares2,3, D Chiruta2,3, C Chong4, P Pougnet5 ,C Meis2,6 and A El Hami7
1 LATMOS /IPSL, UVSQ Université Paris-Saclay, UPMC Univ. Paris 06, CNRS, F-78280, Guyancourt, France.
2 CHAIR Materials Simulation and Engineering, UVSQ, Université Paris Saclay, 78035 Versailles Cedex, France.
3 GEMaC, CNRS-UMR 8635, Université de Versailles St. Quentin en Yvelines, 78035 Versailles, France
4 LISV, Université de Versailles St. Quentin en Yvelines, 78035 Versailles, France
5 VALEO, BP 68532 Cergy, 95892 Cergy Pontoise Cedex, France.
6 INSTN- CEA-Saclay – 91191 Gif-sur-Yvette Cedex, France.
7 INSA de ROUEN Laboratoire de Mécanique, Pôle Technologique du Madrillet, BP 8-76801 Saint Etienne du Rouvray, France.

Monte Carlo entropic sampling applied to Ising-like model for 2D and 3D systems

Journal of Physics: Conference Series 738 (2016) 012072
C M Jureschi1,2, J Linares3,*, P R Dahoo4, Y Alayli1
1 LISV, UVSQ, Université Paris Saclay, 78140 Vélizy, France.
2 Faculty of Electrical Engineering and Computer Science & MANSiD, USV, Suceava, 720229, Romania.
3 GEMaC, UVSQ, Université Paris Saclay, 78035 Versailles Cedex, France.
4 LATMOS, UVSQ, Université Paris Saclay, F-78280, Guyancourt.

Simulating Relaxation Channels of CO2 in Clathrate Nano-cages

Journal of Physics: Conference Series 738 (2016) 012072
P. R. Dahoo1,2, R. Puig2, A. Lakhlifi3, C. Meis2,4 and J. D. Gale2,5
1 LATMOS /IPSL, UVSQ Université Paris-Saclay, UPMC Univ. Paris 06, CNRS, F-78280, Guyancourt, France.
2 CHAIR Materials Simulation and Engineering, UVSQ, Université Paris Saclay, 78035 Versailles Cedex, France.
3 Institut UTINAM-UMR 6213 CNRS- Université de Franche-Comté, Observatoire de Besançon, 25010 Besançon Cedex, France.
4 INSTN- CEA, Université Paris Saclay – 91191 Gif-sur-Yvette, France. 5 Nanochemistry Research Institute/Curtin Institute for Computation, Department of Chemistry, Curtin University, PO Box U1987, Perth, WA 6845, Australia.

Book Chapter “Embedded Mechatronic Systems 2. Analysis of Failures, Modeling, Simulation and Optimization”

Abdelkhalak El Hami et Philippe Pougnet. Elsevier, Chapter 4, 2015, ISBN : 978-1-78548-014-0 – insu-01154803
Impact of voids in interconnection materials
Dahoo P.-R., Khettab M., Chong C., Girard A., Pougnet. P.

Book Chapter “Embedded Mechatronic Systems 2. Analysis of Failures, Modeling, Simulation and Optimization”

Abdelkhalak El Hami et Philippe Pougnet.
Elsevier, Chapter 1, 2015, ISBN : 978-1-78548-014-0 – insu-01154806

Highly Accelerated Testing
Pougnet P., Dahoo P.-R., Alavarez J.-L.

Book Chapter “Embedded Mechatronic Systems 1. Analysis of Failures, Predictive Reliability”

Abdelkhalak El Hami et Philippe Pougnet.
Elsevier, Chapter 8, 2015, 978-1-78548-013-3 – insu-01155286

Reliability Prediction of embedded Electronic Systems: The FIDES Guide
Pougnet P., Bayle F., Maanane H., Dahoo P.-R.

Book Chapter “Embedded Mechatronic Systems 1. Analysis of Failures, Predictive Reliability”

Abdelkhalak El Hami et Philippe Pougnet
Elsevier, Chapter 2, 2015, 978-1-78548-013-3 – insu-01155342

Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices
Dahoo P.-R., Khettab M., Linares J., Pougnet P.

Book “Light and Vacuum”  The Wave-particle nature of the light and the Quantum vacuum through the coupling of  Electromagnetic theory and Quantum Electrodynamics”

http://www.worldscientific.com/worldscibooks/10.1142/9357

Contact: Professor Constantin Meis, National Institute for Nuclear Science and Technology

 Book “Themodynamics and Statistical Mechanics”

http://www.librarynet.com.my/pls/angkasa/opac3_view.display_brief?v_bib=158592&v_product=OPAC&v_location=

Contact: Professor Julian D. Gale, Curtin University

Book Chapter “ SIESTA : A linear-scaling method for density functional calculations”

http://onlinelibrary.wiley.com/doi/10.1002/9780470930779.ch2/summary

Contact: Prodessor Julian D. Gale, Curtin University

 Book “Computational Thermodynamics, The Calphad Method”

http://www.cambridge.org/fr/academic/subjects/engineering/materials-science/computational-thermodynamics-calphad-method?format=HB

Contact : Professor Bo Sundman, KTH and INSTN-CEA

PhD “Study of the resine influence on the Insulated Metal Leadframe (IML) level of the megatronics current commutator module”

The Chair has participated to the PhD thesis of Mrs Malika Khettab of Versailles University (UVSQ) : “Study of the resine influence on the Insulated Metal Leadframe (IML) level of the megatronics current commutator module” Contact: Professors Pierre Richard Dahoo (UVSQ) and Constantin Meis (National Institute for Nuclear Science and Technology)

Experiment and Modelling in Structural NMR

http://www.epj-conferences.org/index.php?option=com_toc&url=/articles/epjconf/abs/2012/12/contents/contents.html

Fundamentals of Thermodynamic Modelling of Materials

http://www.epj-conferences.org/index.php?option=com_toc&url=/articles/epjconf/abs/2011/04/contents/contents.html